Document Details A detailed analysis of the optical beam deflection technique for use in atomic force microscopy:
Number of documents found: 1
- Title: A detailed analysis of the optical beam deflection technique for use in atomic force microscopy
- Author: A.J. Putman
- Publisher:
Other Keywords: optical sensor atomic forc microsocopy
Notes: sensors for small deflections
Pages: 6 - 12
BHM No: 8172
Parent Document ID: 6161 - Parent Document Title: Journal of Applied Physics - Publisher:
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